Legal Risk Management for In-House Counsel and Managers

A Manager’s Guide to Legal and Corporate Risk Management

by Bryan E. Hopkins


Formats

Softcover
$26.95
Hardcover
$43.95
E-Book
$15.99
Softcover
$26.95

Book Details

Language : English
Publication Date : 29/10/2013

Format : Softcover
Dimensions : 6x9
Page Count : 296
ISBN : 9781482896367
Format : Hardcover
Dimensions : 6x9
Page Count : 296
ISBN : 9781482896374
Format : E-Book
Dimensions : N/A
Page Count : 296
ISBN : 9781482896381

About the Book

Companies must either properly manage the complex world of legal and corporate risk or suffer the consequences. Author Bryan E. Hopkins, the former General Counsel of Samsung Electronics America, identifies the numerous areas of legal and corporate risk that managers and their company counsel face daily. More importantly, he provides concrete examples that demonstrate how to minimize or mitigate legal and corporate risk. He provides case studies, practical information, and insights to help you • conduct an initial legal risk assessment; • establish a compliance program; • retain records that minimize risk; • transfer risk;and • navigate the discovery process. Legal counsel must take an active effort in developing strategies, systems, and processes that minimize the legal risks faced by the company on a daily basis. Managers must also be involved to ensure the company develops a successful legal risk management program. Many companies don’t think about risk management until they’re confronted with class-action lawsuits, product liability claims, government investigations, shareholder actions and fines. Take a proactive approach to protecting your company with Legal Risk Management for In-House Counsel and Managers.


About the Author

Bryan E. Hopkins is a Professor of Law in the Graduate School of Business, Sejong University, Seoul, Korea. He is a past General Counsel of Samsung Electronics America and has counselled multinational corporations and subsidiaries throughout the world on managing and mitigating legal risk and exposure.